Benchmarking Gate Fidelities in a $\mathrm{Si}/\mathrm{SiGe}$ Two-Qubit Device

Benchmarking Gate Fidelities in a $\mathrm{Si}/\mathrm{SiGe}$ Two-Qubit Device

aps.org - X. Xue, T. F. Watson, J. Helsen, D. R. Ward, D. E. Savage, M. G. Lagally, S. N. Coppersmith, M. A. Eriksson, S. Wehner, and L. M. K. Vandersypen

Author(s): X. Xue, T. F. Watson, J. Helsen, D. R. Ward, D. E. Savage, M. G. Lagally, S. N. Coppersmith, M. A. Eriksson, S. Wehner, and L. M. K. …

View on aps.org